AMD present results of case studies with TeraView at ISTFA 2017
TeraView, the pioneer and leader in Terahertz technology and solutions, is pleased to announce the joint publication of a paper at the International Society for Test and Failure Analysis (ISTFA) conference in Pasadena, California between teams from Advanced Micro Devices (AMD) and TeraView Ltd in the UK. The paper was presented by Ms. Bernice Zee from AMD Singapore at the event.
The paper, the result of a collaboration between the two companies, introduces the capability of TeraView’s patented Electro Optical Terahertz Pulse Reflectometry (EOTPR) technology to quickly and accurately isolate fault locations. AMD tested the technology on its latest 2.5D high end graphics chip set.
Dr. Jesse Alton, semiconductor product manager and applications manager at TeraView commented, “We are pleased to work with AMD to highlight EOTPR’s capabilities in solving challenging issues in advanced IC packaging technology, and we are delighted with the publication of this joint paper”.
According to Martin Igarashi, TeraView’s VP of Semiconductor Business. “It was great to see that the EOTPR technology is gaining greater industry wide recognition at this conference. This is demonstrated by not only this paper from AMD, but a further EOTPR related paper from ASE and 3 tutorial sessions all mentioning EOTPR as the key technology to solve advanced IC packaging problems.”
Dr. Don Arnone, TeraView’s CEO, commented, “The work with AMD and other customers at ISTFA are excellent examples of TeraView’s collaborative approach when working with customers in the industry. We benefit greatly from collaborating with experienced industry personnel such as Ms. Zee, and this in turn helps us to better optimise our unique EOTPR solutions to meet our customers’ needs”.
Terahertz light lies between infra red and microwaves, and as such has unique properties which enables it to pass through objects and to transmit images and compositional (spectroscopic) information that is ordinarily hidden. Terahertz is non destructive, safe and fast, making it the ideal inspection and imaging modality for many applications across a range of industries. TeraView has demonstrated the potential of terahertz technology in a number of applications including the detection of hidden weapons and explosives in security screening, monitoring the quality of pharmaceutical drugs, high value coatings used in automotive and other industries, as well as medical imaging of cancer.
TeraView is the world’s first and leading company solely focused upon the application of terahertz light to provide solutions to customer issues. A spin out from the Toshiba Corporation and Cambridge University, TeraView has developed its proprietary technology across a number of markets. These include fault analysis and quality assurance for semiconductor chips used in mobile computing and communications, as well as non destructive inspection of high value coatings used in the automotive, pharmaceutical, food and solar industries. With the largest number of systems in the field, as well as applications know-how made available to customers via a team of dedicated scientists using intellectual property and knowledge in peer-reviewed scientific publications, TeraView is uniquely placed to deliver the business benefits of terahertz to customers. Headquartered in Cambridge UK, sales and customer support are available throughout the Far East, North America and Europe either directly or through a network of distributors.