TeraView expands its intellectual property portfolio in Korea and Taiwan protecting semiconductor chip test & inspection TeraView, the pioneer and leader in terahertz technology and solutions is pleased to announce that the Company has been awarded two new...
20 – 21 May 2025 TeraView will be exhibiting at the 12th CAM-Workshop on ‘Failure Analysis and Material Diagnostics of Electronics Components’ on 20th and 21st May 2025. Halle, Germany. For more information click...
Multiple damage identification of epoxy coating structures based on terahertz pulse imaging technology and machine learning Tu, Wanli, Shuncong Zhong, Qiukun Zhang, Yi Huang, and Manting Luo.AbstractTo enhance the diagnostic capabilities of defective epoxy coating...
Exploring the Absorbable Hemostats Reaction using ATR THz Time-Domain Spectroscopy Nedvedova, M., Kresalek, V., Adamik, Z. and Pałka, N.AbstractThis article describes the measurement, analysis, and modeling of the absorbable hemostats’ kinetic reaction using the...
Efficient multi-objective optimization for switchable digital coding metasurface absorber empowered by machine learning Zhang, S., Wen, F., Wang, F., Zhai, M., Wang, J., Wang, R., Zhang, M., Li, J., Tong, Z., Wang, W. and Zhang, Y.AbstractMulti-functional metasurface...