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Articles & Papers

TeraView’s strong commitment to fundamental and applied THz research and development, combined with its drive to understand and interpret terahertz data, is represented in academic publications and international journals.

Defect Localization in Through-Si-Interposer Based 2.5D ICs

Gourikutty, Sajay Bhuvanendran Nair, Yew Meng Chow, Jesse Alton, Ratan Bhimrao Umralkar, Haonan Bai, Kok Keng Chua, and Surya Bhattacharya. "Defect Localization in Through-Si-Interposer Based 2.5 D ICs." In 2020 IEEE 70th Electronic Components and Technology...

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