5th-9th November 2017

Pasadena Convention Center, Pasadena, CA, USA.

TeraView will be exhibiting at this year’s ISTFA 2017.

Along with exhibiting at the event, TeraView’s Martin Igarashi and Dr Jesse Alton will present a talk entitled ‘Non-Destructive Fault Localization in 2.5D Packages Using Electro Optical Terahertz Pulse Reflectometry’, the talk is due to take place on Monday 6th November in Ballroom A of the Pasadena Convention Center.

Full details can be found here.