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Influence of SiO2 nanoparticles on morphology, optical, and conductivity properties of Poly (ethylene oxide)

Jun 29, 2020

Hameed, Talaat A., F. Mohamed, A. M. Abdelghany, and G. Turky. “Influence of SiO.”


In this work, a detailed insight to the microstructure, morphology, surface topography, electrical and optical properties in visible and terahertz range was presented for polyethylene oxide (PEO)/silicon dioxide SiO2 nanocomposites. PEO-filled with various contents of SiO2 nanoparticles were synthesized via the solution cast technique. The polycrystalline nature of PEO/SiO2 films was affirmed by the selected area electron diffraction pattern (SAED) recorded by HRTEM measurement and it was found to nearly conformable with X-ray diffraction data. The energy-dispersive X-ray analysis (EDAX) proved the existence of SiO2 with wt% ranged from 0 to 5% as starting fillers. The high-resolution scanning electron microscope planar images indicated uniform distribution of SiO2 nanoparticles within the PEO films. The atomic force microscope 3D images depicted the surface changed from rough to smooth upon the filling with SiO2. The composite samples exhibit absorption spectra that extended from UV–Vis to near infrared regions. Based on Tauc’s formula, it was found that the absorption edge shifted from 4.90 to 3.20 eV as the filler fraction increased from 0 to 5 wt%. The analysis of reflective index in the UV–Vis–NIR regions displayed decrement with increasing filler content. Moreover, the refractive index in Vis–NIR regions is good extension to that in THz region expressing the optical quality of studied films. The optical dispersion parameters were analyzed in the view of Wemple-Didomenico single oscillator and Sellmeier model. The values of nonlinear optical parameters (nonlinear susceptibility χ(3) and nonlinear refractive index (n2) were influenced by the filler fractions. Upon the rise of filler content, the conductivity values show slightly decrement.