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Defect Localization in Through-Si-Interposer Based 2.5D ICs

Defect Localization in Through-Si-Interposer Based 2.5D ICs Gourikutty, Sajay Bhuvanendran Nair, Yew Meng Chow, Jesse Alton, Ratan Bhimrao Umralkar, Haonan Bai, Kok Keng Chua, and Surya Bhattacharya. “Defect localization in through-Si-interposer based 2.5 D...