Exploring the dielectric, THz, optical, and structural evaluation of graphene/PMMA films for optoelectronic devices Bakr, Ahmed M., Abdelfattah Darwish, A. A. Azab, and Amir Elzwawy.AbstractThe presented research highlights the PMMA doping with reduced graphene...
Recent Developments in EOTPR Towards a Fully Automated Tool for High Volume Failure Analysis White, T., Alton, J., Gibson, B., Igarashi, M., Liao, J., Pham, T. and Marks, H.AbstractDevelopments in backside power delivery (BPD) technology will become increasingly...
TeraView expands its intellectual property portfolio in Korea and Taiwan protecting semiconductor chip test & inspection TeraView, the pioneer and leader in terahertz technology and solutions is pleased to announce that the Company has been awarded two new...
20 – 21 May 2025 TeraView will be exhibiting at the 12th CAM-Workshop on ‘Failure Analysis and Material Diagnostics of Electronics Components’ on 20th and 21st May 2025. Halle, Germany. For more information click...
Multiple damage identification of epoxy coating structures based on terahertz pulse imaging technology and machine learning Tu, Wanli, Shuncong Zhong, Qiukun Zhang, Yi Huang, and Manting Luo.AbstractTo enhance the diagnostic capabilities of defective epoxy coating...
